Interuniversitair Microelectronicacentrum IMEC is one of the largest independent R&D institutes world-wide, with an international staff of over 2000 people of 70 different nationalities. IMEC performs scientific research which runs 3 to 10 years ahead of industrial needs. The most important scientific activities are concentrated on the development of technologies for: (1) Advanced CMOS devices; (2) Smart System and Energy; (3) Life sciences. IMEC’s R&D strategy is based on three pillars: Firstly, IMEC co-operates closely with world-leading companies and research centers all over the world in a cost-sharing model. Secondly, IMEC performs education and training of experts in the field of microelectronics through its microelectronics training center and through Master and Ph.D. theses (about 250 PhD students and visiting scientists in 2013). Finally, IMEC has a strong network of university connections to employ the available competence as optimally as possible, on research and development as well as on training. IMEC has created 27 spin-off companies in its 30 years of existence.
The Large Area Electronics activities at Imec started in 1998 and has grown in a wide spectrum of activities on flexible displays, image sensors, photovoltaics and electronic circuits on plastic foil. IMEC is collaborating with TNO in the HOLST Center Shared Technology programs. As part of this program, imec runs jointly with TNO a 6” round and Gen1 (sheet 32cm x 35cm ) flat panel display line allowing full integrated process flows for flexible displays, imagers and VLSI TFT circuits on plastic foil. The TFT performance realized is far beyond state of the art and does not exist otherwise in Europe.
IMEC has built up advanced design and simulation capabilities for TFT applications. DRM and PDK of the TFT, OLEDs, OPD are refined during constant manufacturing / measurement cycles, allowing the demonstration of flexible AMOLED displays, X-ray imagers and VLSI circuits up to microprocessors on foil.
Imec has some of the most advanced electrical measurement and material / device characterization capabilities of the semiconductor industry allowing massive high-throughput mapping of electrical devices and failure analysis.